Construct · 1 fields · 1 citations

atomic force microscopy: a standalone construct

One name. One construct. A landmark on the map.

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atomic forcemicroscopy1 CONSTRUCTAtomic force microscopyBINNIG · MICROSCOPY

A single standalone construct; nearby constructs are located against it in the Collider. Tap a field for its definition, unit, and measures.

Microscopy

imaging surfaces by scanning a sharp tip on a cantilever and sensing its deflection by interatomic forces.

In microscopy, atomic force microscopy refers to imaging surfaces by scanning a sharp tip on a cantilever and sensing its deflection by interatomic forces. This meaning comes from Binnig (1986) in Physical Review Letters.[1]

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Nearby constructs

deflection4 fields · 7 citationsjingle · one word, four constructsforce5 fields · 9 citationsjingle · one word, five constructs

References

  1. Binnig, G., Quate, C. F., & Gerber, C. (1986). Atomic Force Microscope. Physical Review Letters, 56(9), 930-933. https://doi.org/10.1103/physrevlett.56.930

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