Construct · 1 fields · 1 citations

Chynoweth law: a standalone construct

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Microelectronics and semiconductor devices

an empirical relation in which carrier impact ionization rates in a semiconductor rise exponentially with the negative inverse of the electric field.

In microelectronics and semiconductor devices, Chynoweth law refers to an empirical relation in which carrier impact ionization rates in a semiconductor rise exponentially with the negative inverse of the electric field. This meaning comes from Chynoweth (1958) in Physical Review.[1]

Unit
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Measured by

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Nearby constructs

impact ionization1 fields · 1 citationsanchor · a standalone construct carrier3 fields · 3 citationsjingle · one word, three constructs field3 fields · 5 citationsjingle · one word, three constructs

References

Chynoweth, A. G. (1958). Ionization Rates for Electrons and Holes in Silicon. Physical Review, 109(5), 1537-1540. https://doi.org/10.1103/physrev.109.1537

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