Construct · 1 fields · 1 citations

electronic speckle pattern interferometry: a standalone construct

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Metrology

full-field measurement of surface displacement by correlating speckle interferograms recorded electronically before and after deformation.

In metrology, electronic speckle pattern interferometry refers to full-field measurement of surface displacement by correlating speckle interferograms recorded electronically before and after deformation. This meaning comes from Butters (1971) in Optics & Laser Technology.[1]

Unit
Recovery means
Measured by

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Nearby constructs

displacement5 fields · 6 citationsjingle · one word, five constructs measurement3 fields · 5 citationsjingle · one word, three constructs pattern4 fields · 5 citationsjingle · one word, four constructs

References

Butters, J. N., & Leendertz, J. A. (1971). Speckle pattern and holographic techniques in engineering metrology. Optics & Laser Technology, 3(1), 26-30. https://doi.org/10.1016/s0030-3992(71)80007-5

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