Construct · 1 fields · 1 citations

hot carrier injection: a standalone construct

One name. One construct. A landmark on the map.

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Semiconductor devices

damage to transistors when high-energy carriers gain enough energy to enter the gate oxide, shifting device characteristics over time.

In semiconductor devices, hot carrier injection refers to damage to transistors when high-energy carriers gain enough energy to enter the gate oxide, shifting device characteristics over time. This meaning comes from Hu (1985) in IEEE Journal of Solid-State Circuits.[1]

Unit
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Nearby constructs

carrier3 fields · 3 citationsjingle · one word, three constructs energy5 fields · 10 citationsjingle · one word, five constructs gain4 fields · 4 citationsjingle · one word, four constructs

References

Hu, C., Tam, S. C., Hsu, F.-C., Ko, P.-K., Chan, T.-Y., & Terrill, K. W. (1985). Hot-Electron-Induced MOSFET Degradation - Model, Monitor, and Improvement. IEEE Journal of Solid-State Circuits, 20(1), 295-305. https://doi.org/10.1109/jssc.1985.1052306

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