Construct · 1 fields · 1 citations

current collapse: a standalone construct

One name. One construct. A landmark on the map.

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Semiconductor devices

a drop in GaN transistor output current after high-voltage stress, caused by electrons trapped in surface states acting as a virtual gate.

In semiconductor devices, current collapse refers to a drop in GaN transistor output current after high-voltage stress, caused by electrons trapped in surface states acting as a virtual gate. This meaning comes from Vetury (2001) in IEEE Transactions on Electron Devices.[1]

Unit
Recovery means
Measured by

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Nearby constructs

collapse4 fields · 5 citationsjingle · one word, four constructs current3 fields · 6 citationsjingle · one word, three constructs gate5 fields · 6 citationsjingle · one word, five constructs

References

Vetury, R., Zhang, N. Q., Keller, S., & Mishra, U. K. (2001). The impact of surface states on the DC and RF characteristics of AlGaN/GaN HFETs. IEEE Transactions on Electron Devices, 48(3), 560-566. https://doi.org/10.1109/16.906451

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