Construct · 1 fields · 1 citations

electromigration: a standalone construct

One name. One construct. A landmark on the map.

● anchor · a standalone construct Nearest construct by meaning·not indexed
electromigration1 CONSTRUCTElectromigrationBLACK · SEMICONDUCTOR DEVICES

A single standalone construct; nearby constructs are located against it in the Collider. Tap a field for its definition, unit, and measures.

Semiconductor devices

the gradual movement of metal atoms in interconnects pushed by electron flow, causing voids and failure.

In semiconductor devices, electromigration refers to the gradual movement of metal atoms in interconnects pushed by electron flow, causing voids and failure. This meaning comes from Black (1969) in IEEE Transactions on Electron Devices.[1]

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Nearby constructs

Blech length1 fields · 1 citationsanchor · a standalone constructfailure4 fields · 6 citationsjingle · one word, four constructsflow6 names · 12 citationsjangle · five names, one experience, partly

References

  1. Black, J. R. (1969). Electromigration: A brief survey and some recent results. IEEE Transactions on Electron Devices, 16(4), 338-347. https://doi.org/10.1109/t-ed.1969.16754

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