Construct · 1 fields · 1 citations

Murphy yield model: a standalone construct

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Microelectronics and semiconductor devices

an integrated circuit yield model that averages Poisson defect yield over a distribution of defect densities across wafers.

In microelectronics and semiconductor devices, Murphy yield model refers to an integrated circuit yield model that averages Poisson defect yield over a distribution of defect densities across wafers. This meaning comes from Murphy (1964) in Proceedings of the IEEE.[1]

Unit
Recovery means
Measured by

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Nearby constructs

circuit1 fields · 1 citationsanchor · a standalone construct defect4 fields · 7 citationsjingle · one word, four constructs distribution2 fields · 2 citationsjingle · one word, two constructs

References

Murphy, B. T. (1964). Cost-size optima of monolithic integrated circuits. Proceedings of the IEEE, 52(12), 1537-1545. https://doi.org/10.1109/proc.1964.3442

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