Construct · 1 fields · 1 citations

negative binomial yield model: a standalone construct

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Microelectronics and semiconductor devices

an integrated circuit yield model in which defect counts follow a negative binomial distribution, capturing the clustering of defects across a wafer.

In microelectronics and semiconductor devices, negative binomial yield model refers to an integrated circuit yield model in which defect counts follow a negative binomial distribution, capturing the clustering of defects across a wafer. This meaning comes from Stapper (1973) in IEEE Transactions on Electron Devices.[1]

Unit
Recovery means
Measured by

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Nearby constructs

circuit1 fields · 1 citationsanchor · a standalone construct defect4 fields · 7 citationsjingle · one word, four constructs distribution2 fields · 2 citationsjingle · one word, two constructs

References

Stapper, C. H. (1973). Defect density distribution for LSI yield calculations. IEEE Transactions on Electron Devices, 20(7), 655-657. https://doi.org/10.1109/t-ed.1973.17719

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