Construct · 1 fields · 1 citations

stuck-at fault model: a standalone construct

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stuck-atfault model1 CONSTRUCTStuck-at fault modelELDRED · MICROELECTRONICS AND

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Microelectronics and semiconductor devices

a digital test model that represents physical defects as circuit lines permanently fixed at logic 0 or 1, used to measure test coverage.

In microelectronics and semiconductor devices, stuck-at fault model refers to a digital test model that represents physical defects as circuit lines permanently fixed at logic 0 or 1, used to measure test coverage. This meaning comes from Eldred (1959) in Journal of the ACM.[1]

Unit
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Measured by

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Nearby constructs

circuit1 fields · 1 citationsanchor · a standalone constructcoverage3 fields · 3 citationsjingle · one word, three constructsfault3 fields · 3 citationsjingle · one word, three constructs

References

  1. Eldred, R. D. (1959). Test Routines Based on Symbolic Logical Statements. Journal of the ACM, 6(1), 33-37. https://doi.org/10.1145/320954.320957

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