Construct · 1 fields · 1 citations

transfer length method: a standalone construct

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Semiconductor devices

a test structure and analysis that separates contact resistance from sheet resistance by measuring resistance between contacts at several spacings.

In semiconductor devices, transfer length method refers to a test structure and analysis that separates contact resistance from sheet resistance by measuring resistance between contacts at several spacings. This meaning comes from Berger (1972) in Solid-State Electronics.[1]

Unit
Recovery means
Measured by

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Nearby constructs

contact2 fields · 3 citationsjingle · one word, two constructs resistance4 fields · 7 citationsjingle · one word, four constructs sheet1 fields · 1 citationsanchor · a standalone construct

References

Berger, H. H. (1972). Models for contacts to planar devices. Solid-State Electronics, 15(2), 145-158. https://doi.org/10.1016/0038-1101(72)90048-2

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