Construct · 1 fields · 1 citations

total ionizing dose effects: a standalone construct

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Space environment

cumulative degradation of electronic devices from charge trapped in oxides and at interfaces as ionizing radiation dose builds up.

In space environment, total ionizing dose effects refers to cumulative degradation of electronic devices from charge trapped in oxides and at interfaces as ionizing radiation dose builds up. This meaning comes from Oldham (2003) in IEEE Transactions on Nuclear Science.[1]

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Nearby constructs

charge1 fields · 2 citationsanchor · a standalone construct degradation3 fields · 5 citationsjingle · one word, three constructs dose3 fields · 3 citationsinvariant · one construct, three systems

References

Oldham, T. R., & McLean, F. B. (2003). Total ionizing dose effects in MOS oxides and devices. IEEE Transactions on Nuclear Science, 50(3), 483-499. https://doi.org/10.1109/tns.2003.812927

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